Stacking Fault Energy of Si Nanocrystals Embedded in SiO2
نویسندگان
چکیده
منابع مشابه
Amorphization of Ge and Si nanocrystals embedded in amorphous SiO2 by ion irradiation
M. Backman,1 F. Djurabekova,1,2,* O. H. Pakarinen,1 K. Nordlund,1 L. L. Araujo,3 and M. C. Ridgway3 1Helsinki Institute of Physics and Department of Physics, University of Helsinki, P.O. Box 43, Helsinki FI-00014, Finland 2Arifov Institute of Electronics, Durmon yuli 33, 100125 Tashkent, Uzbekistan 3Department of Electronic Materials Engineering, Research School of Physical Sciences and Enginee...
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ژورنال
عنوان ژورنال: ISRN Nanotechnology
سال: 2011
ISSN: 2090-6064,2090-6072
DOI: 10.5402/2011/639714